Published:
May 2000
Proceedings:
Proceedings of the Thirteenth International Florida Artificial Intelligence Research Society Conference (FLAIRS 2000)
Volume
Issue:
Proceedings of the Thirteenth International Florida Artificial Intelligence Research Society Conference (FLAIRS 2000)
Track:
All Papers
Downloads:
Abstract:
Identification of affine deformed and simultaneously blur degraded images is an important task in pattern analysis. Use of global moment features has been one of the most popular techniques for pattern recognition and classification. In this paper, we introduce an approach to derive blur and affine combined moment invariants (BACIs). A neural network(NN) model is then employed to classify objects using these BACIs.
FLAIRS
Proceedings of the Thirteenth International Florida Artificial Intelligence Research Society Conference (FLAIRS 2000)
ISBN 978-1-57735-113-9
Published by The AAAI Press, Menlo Park, California.