Published:
2020-06-02
Proceedings:
Proceedings of the AAAI Conference on Artificial Intelligence, 34
Volume
Issue:
Vol. 34 No. 04: AAAI-20 Technical Tracks 4
Track:
AAAI Technical Track: Machine Learning
Downloads:
Abstract:
Metric-based meta-learning has attracted a lot of attention due to its effectiveness and efficiency in few-shot learning. Recent studies show that metric scaling plays a crucial role in the performance of metric-based meta-learning algorithms. However, there still lacks a principled method for learning the metric scaling parameter automatically. In this paper, we recast metric-based meta-learning from a Bayesian perspective and develop a variational metric scaling framework for learning a proper metric scaling parameter. Firstly, we propose a stochastic variational method to learn a single global scaling parameter. To better fit the embedding space to a given data distribution, we extend our method to learn a dimensional scaling vector to transform the embedding space. Furthermore, to learn task-specific embeddings, we generate task-dependent dimensional scaling vectors with amortized variational inference. Our method is end-to-end without any pre-training and can be used as a simple plug-and-play module for existing metric-based meta-algorithms. Experiments on miniImageNet show that our methods can be used to consistently improve the performance of existing metric-based meta-algorithms including prototypical networks and TADAM.
DOI:
10.1609/aaai.v34i04.5752
AAAI
Vol. 34 No. 04: AAAI-20 Technical Tracks 4
ISSN 2374-3468 (Online) ISSN 2159-5399 (Print) ISBN 978-1-57735-835-0 (10 issue set)
Published by AAAI Press, Palo Alto, California USA Copyright © 2020, Association for the Advancement of Artificial Intelligence All Rights Reserved