EEMEFN: Low-Light Image Enhancement via Edge-Enhanced Multi-Exposure Fusion Network

Authors

  • Minfeng Zhu State Key Lab of CAD&CG, Zhejiang University
  • Pingbo Pan The ReLER Lab, University of Technology Sydney
  • Wei Chen State Key Lab of CAD&CG, Zhejiang University
  • Yi Yang The ReLER Lab, University of Technology Sydney

DOI:

https://doi.org/10.1609/aaai.v34i07.7013

Abstract

This work focuses on the extremely low-light image enhancement, which aims to improve image brightness and reveal hidden information in darken areas. Recently, image enhancement approaches have yielded impressive progress. However, existing methods still suffer from three main problems: (1) low-light images usually are high-contrast. Existing methods may fail to recover images details in extremely dark or bright areas; (2) current methods cannot precisely correct the color of low-light images; (3) when the object edges are unclear, the pixel-wise loss may treat pixels of different objects equally and produce blurry images. In this paper, we propose a two-stage method called Edge-Enhanced Multi-Exposure Fusion Network (EEMEFN) to enhance extremely low-light images. In the first stage, we employ a multi-exposure fusion module to address the high contrast and color bias issues. We synthesize a set of images with different exposure time from a single image and construct an accurate normal-light image by combining well-exposed areas under different illumination conditions. Thus, it can produce realistic initial images with correct color from extremely noisy and low-light images. Secondly, we introduce an edge enhancement module to refine the initial images with the help of the edge information. Therefore, our method can reconstruct high-quality images with sharp edges when minimizing the pixel-wise loss. Experiments on the See-in-the-Dark dataset indicate that our EEMEFN approach achieves state-of-the-art performance.

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Published

2020-04-03

How to Cite

Zhu, M., Pan, P., Chen, W., & Yang, Y. (2020). EEMEFN: Low-Light Image Enhancement via Edge-Enhanced Multi-Exposure Fusion Network. Proceedings of the AAAI Conference on Artificial Intelligence, 34(07), 13106-13113. https://doi.org/10.1609/aaai.v34i07.7013

Issue

Section

AAAI Technical Track: Vision