Online Metric Learning for Multi-Label Classification

2020-06-02

Proceedings of the AAAI Conference on Artificial Intelligence, 34

Volume

Vol. 34 No. 04: AAAI-20 Technical Tracks 4

AAAI Technical Track: Machine Learning

Existing research into online multi-label classification, such as online sequential multi-label extreme learning machine (OSML-ELM) and stochastic gradient descent (SGD), has achieved promising performance. However, these works lack an analysis of loss function and do not consider label dependency. Accordingly, to fill the current research gap, we propose a novel online metric learning paradigm for multi-label classification. More specifically, we first project instances and labels into a lower dimension for comparison, then leverage the large margin principle to learn a metric with an efficient optimization algorithm. Moreover, we provide theoretical analysis on the upper bound of the cumulative loss for our method. Comprehensive experiments on a number of benchmark multi-label datasets validate our theoretical approach and illustrate that our proposed online metric learning (OML) algorithm outperforms state-of-the-art methods.

10.1609/aaai.v34i04.5818