Shunfeng Cheng, Michael Pecht
This paper investigates the use of Multivariate State Estimation Techniques as input in predicting the remaining useful life prediction of electronic products. A prognostics approach combining the Multivariate State Estimation Technique with life cycle damage prediction is then presented, along with a case study. The challenges of the approach are also discussed.
Subjects: 1.5 Diagnosis; 1.6 Engineering And Science
Submitted: Sep 14, 2007